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X-Ray Computer Tomography

The 3D CT microscope is used for in-situ characterisation of the composition, deformation and damage development of materials for ICT at length scales on the order of 1 micron.  It is useful for determining the relationship between processing and microstructure, for observing fracture mechanisms, for investigating properties at multiple length scales, and for quantifying and characterising microstructural evolution.

It can perform in-situ and 4D (time dependent) studies to understand the impact of heating, cooling, oxidation, wetting, tension, tensile compression, imbibition, drainage and other simulated environmental studies.

It can perform non-destructive views into deeply buried microstructures that may be unobservable with 2D surface imaging; compositional contrast for studying low Z or “near Z” elements and other difficult-to-discern materials.

A particular emphasis will be the development of specialised loading stages that will allow for accurate monitoring of 3D deformation processes (such as the swelling of a battery) during operation.

If your research interests require specialised 3D observation of microstructure evolution and you have any questions on the tool’s capabilities or would like to discuss your experimental needs, contact technical lead Tony Dennis (ad466@cam.ac.uk) in the Department of Engineering.